Title :
Including higher-order moments of RC interconnections in layout-to-circuit extraction
Author :
Elias, P.J.H. ; Van Der Meijs, N.P.
Author_Institution :
Fac. of Electr. Eng., Delft Univ. of Technol., Netherlands
Abstract :
This paper presents a reduction technique that transforms large RC networks into a minimal admittance network between the terminals, and that at the same time preserves the moments of each admittance exactly, up to any desired order. Any RC network can be dealt with, including capacitive coupling between lines. The technique presented has been incorporated in an efficient layout-to-circuit extractor using a scanline approach. The extracted moments can be used either in combination with Pade approximants for detailed timing-analysis, or simple RC models can be obtained directly by fitting to the extracted moments. The main advantage over AWE is that nodes are eliminated on the fly, thus reducing memory usage up to an order of magnitude
Keywords :
RC circuits; VLSI; circuit layout CAD; electric admittance; integrated circuit interconnections; integrated circuit layout; Pade approximants; RC interconnections; RC models; capacitive coupling; higher-order moments; large RC networks; layout-to-circuit extraction; minimal admittance network; reduction technique; scanline approach; timing analysis; Admittance; Capacitance; Delay effects; Finite element methods; Integrated circuit interconnections; Integrated circuit layout; Intelligent networks; Laplace equations; Paramagnetic resonance; Very large scale integration;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494326