Title :
Terminal reliability models for hypercube interconnection networks
Author :
Chen, D.J. ; Horng, M.S.
Author_Institution :
Dept. of Comput. Sci. & Eng., Nat. Chiao Tung Univ., Hsin Chu, Taiwan
Abstract :
Terminal reliability modeling and analysis of hypercube interconnection networks are discussed. Terminal reliability is the probability that at least one path is working for communication between a given source and a destination. Several reliability modeling concepts are introduced and used to compute the terminal reliability of a hypercube. Time complexity analyses and examples of these reliability modeling approaches are discussed in detail
Keywords :
hypercube networks; performance evaluation; reliability theory; destination; hypercube interconnection networks; path; probability; source; terminal reliability; time complexity; Commercialization; Computer aided manufacturing; Computer architecture; Computer network reliability; Computer networks; Concurrent computing; Degradation; Hypercubes; Multiprocessor interconnection networks; Telecommunication network reliability;
Conference_Titel :
CompEuro '91. Advanced Computer Technology, Reliable Systems and Applications. 5th Annual European Computer Conference. Proceedings.
Conference_Location :
Bologna
Print_ISBN :
0-8186-2141-9
DOI :
10.1109/CMPEUR.1991.257485
