DocumentCode
3441606
Title
Thermionic escape study in p-i-n InP/InAs53 P47 multi-quantum well solar cell
Author
Alemu, A. ; Freundlich, A.
Author_Institution
Phys. Dept., Univ. of Houston, Houston, TX, USA
fYear
2009
fDate
7-12 June 2009
Abstract
Charge carriers thermal activation energies are obtained from the Arrhenius plot of photoluminescence vs. temperature intensity measurements made on InP/InAs53P47 multi-quantum well solar cells. A theoretical investigation consisting of band structure calculation was undertaken in order to determine the height of the effective potential barriers seen by photo-carriers created in the InAs53P47 quantum wells. A very good agreement is found between experimentally obtained activation energies and theoretically determined effective potential barriers. These results infer that light holes thermionic escape drives the PL intensity decrease at lower temperatures. For an intermediate temperature range, a PL activation energy corresponding to the difference in effective confining potential barrier between heavy holes and light holes is obtained. At higher temperatures, the PL extinction process is dominated by direct heavy-hole escape. These results offer some insights for better designs of photovoltaic quantum confined devices.
Keywords
III-V semiconductors; arsenic compounds; indium compounds; photoluminescence; quantum well devices; semiconductor quantum wells; solar cells; thermionic emission; Arrhenius plot; InP-InAs53P47; band structure calculation; charge carriers; effective potential barriers; heavy-hole escape; light holes; multi-quantum well solar cell; photocarriers; photoluminescence; photovoltaic quantum confined devices; temperature intensity; thermal activation energies; thermionic escape; Charge carriers; Indium phosphide; PIN photodiodes; Photoluminescence; Photovoltaic cells; Photovoltaic systems; Quantum mechanics; Solar power generation; Temperature distribution; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location
Philadelphia, PA
ISSN
0160-8371
Print_ISBN
978-1-4244-2949-3
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2009.5411285
Filename
5411285
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