• DocumentCode
    3441837
  • Title

    Character recognition by neural networks with single-layer training and rejection mechanism

  • Author

    Lim, Joonho ; Lee, Eelwan ; Chae, Soo-Ik

  • Author_Institution
    Dept. of Electron. Eng., Seoul Nat. Univ., South Korea
  • Volume
    6
  • fYear
    1994
  • fDate
    30 May-2 Jun 1994
  • Firstpage
    327
  • Abstract
    For many real applications of pattern classification problems, it is more important to reduce the misclassification rate than to increase the rate of successful classification. In this paper, we propose a single-layer neural network with two rejection mechanisms for character recognition problems, which guarantees a very low misclassification rate. The proposed architecture is a cascaded connection of an SLP network and a simple combinational circuit. Comparing to the MLP network, it yields fast learning and requires a simple hardware architecture. We also introduce a new linearly separable coding scheme for training the SLP network to reduce the misclassification rate. We prepared two databases: one with 135,000 digit patterns and the other with 117,000 letter patterns. Then we applied the proposed method to the classification problem for the databases and results show that the misclassification rate is significantly low with maintaining a high recognition rate
  • Keywords
    character recognition; neural nets; pattern classification; perceptrons; SLP network; cascaded connection; character recognition; digit patterns; hardware architecture; letter patterns; linearly separable coding scheme; misclassification rate; neural networks; pattern classification problems; recognition rate; rejection mechanism; single-layer training; Backpropagation algorithms; Character recognition; Combinational circuits; Databases; Hamming distance; Neural network hardware; Neural networks; Noise figure; Nonhomogeneous media; Pattern classification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-1915-X
  • Type

    conf

  • DOI
    10.1109/ISCAS.1994.409592
  • Filename
    409592