• DocumentCode
    3441903
  • Title

    Low phase noise array-composite micromechanical wine-glass disk oscillator

  • Author

    Lin, Yu-Wei ; Li, Sheng-Shian ; Ren, Zeying ; Nguyen, Clark T -C

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI
  • fYear
    2005
  • fDate
    5-5 Dec. 2005
  • Lastpage
    281
  • Abstract
    A reduction in phase noise by 13 dB has been obtained over a previous 60-MHz surface-micromachined micromechanical resonator oscillator by replacing the single resonator normally used in such oscillators with a mechanically-coupled array of them to effectively raise the power handling ability of the frequency selective tank. Specifically, a mechanically-coupled array of nine 60-MHz wine-glass disk resonators embedded in a positive feedback loop with a custom-designed, single-stage, zero-phase-shift sustaining amplifier achieves a phase noise of -123 dBc/Hz at 1 kHz offset and -136 dBc/Hz at far-from-carrier offsets. When divided down to 10 MHz, this effectively corresponds to -138 dBc/Hz at 1 kHz offset and -151 dBc/Hz at far from carrier offset, which represent 13 dB and 4 dB improvements over recently published work on surface-micromachined resonator oscillators, and also now beat stringent GSM phase noise requirements by 8 dB and 1 dB, respectively
  • Keywords
    circuit feedback; coupled circuits; micromachining; micromechanical resonators; oscillators; phase noise; 10 MHz; 60 MHz; composite micromechanical wine-glass disk oscillator; frequency selective tank; mechanically-coupled array; micromechanical resonator oscillator; phase noise; positive feedback loop; surface-micromachined oscillator; wine-glass disk resonators; zero-phase-shift sustaining amplifier; Coupling circuits; Electrodes; Feedback loop; Frequency; GSM; Micromechanical devices; Optical coupling; Oscillators; Phase noise; Phased arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-9268-X
  • Type

    conf

  • DOI
    10.1109/IEDM.2005.1609328
  • Filename
    1609328