Title :
Exploit analog IFA to improve specification based tests [of SC circuits]
Author :
Atzema, Bert ; Zwemstra, Taco
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
In the recent past Inductive Fault Analysis (IFA) has been exploited for several aspects of analog testing. These include, test development, DfT schemes qualification, and fault grading. However, little attention is paid towards exploiting IFA in the design domain. In this paper we undertake a case study demonstrating how IFA can be exploited for improving specification based testing by design measures. The case study shows that the fault escape rate is lowered while specification based tests guarantee the parametric behavior
Keywords :
analogue integrated circuits; design for testability; fault diagnosis; integrated circuit testing; switched capacitor networks; DfT schemes qualification; SC circuits; analog IFA; analog testing; design domain; design measures; fault escape rate; fault grading; inductive fault analysis; parametric behavior; specification based tests; test development; Analog integrated circuits; Circuit analysis; Circuit faults; Circuit testing; Filters; Impedance; Signal analysis; Speech analysis; Switched capacitor circuits; Telephony;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494353
