Title :
Approaches to on-chip testing of mixed signal macros in ASICs
Author_Institution :
Sch. of Eng., Exeter Univ., UK
Abstract :
This paper initially researches the use of available low-cost analogue CMOS macros to perform simple on-chip tests on the Analogue to Digital Converter macro. The results are evaluated for these tests and then further fuller tests are undertaken. The technique of transient response testing is then applied to three CMOS analogue and mixed submacros to provide more comprehensive test results
Keywords :
analogue-digital conversion; integrated circuit testing; mixed analogue-digital integrated circuits; transient analysis; transient response; A/D convertor macro; ASICs; comprehensive test results; mixed signal macros; on-chip testing; transient response testing; Analog-digital conversion; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Cost function; Performance evaluation; Signal generators; System testing; Transient response;
Conference_Titel :
European Design and Test Conference, 1996. ED&TC 96. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-8186-7424-5
DOI :
10.1109/EDTC.1996.494355
