Approaches to on-chip testing of mixed signal macros in ASICs

Author

Cobley, R.A.

Author_Institution

Sch. of Eng., Exeter Univ., UK

fYear

1996

fDate

11-14 Mar 1996

Firstpage

553

Lastpage

557

Abstract

This paper initially researches the use of available low-cost analogue CMOS macros to perform simple on-chip tests on the Analogue to Digital Converter macro. The results are evaluated for these tests and then further fuller tests are undertaken. The technique of transient response testing is then applied to three CMOS analogue and mixed submacros to provide more comprehensive test results

Keywords

analogue-digital conversion; integrated circuit testing; mixed analogue-digital integrated circuits; transient analysis; transient response; A/D convertor macro; ASICs; comprehensive test results; mixed signal macros; on-chip testing; transient response testing; Analog-digital conversion; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Cost function; Performance evaluation; Signal generators; System testing; Transient response;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1996. ED&TC 96. Proceedings

Conference_Location

Paris

ISSN

1066-1409

Print_ISBN

0-8186-7424-5

Type

conf

DOI

10.1109/EDTC.1996.494355

Filename

494355

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3441976