• DocumentCode
    3442297
  • Title

    A combined pairing and chaining algorithm for CMOS layout generation

  • Author

    Velasco, Josep A. ; Marín, Xavier ; Llopis, Rafael Peset ; Carrabina, Jordi

  • Author_Institution
    Centro Nacional de Microelectron., Univ. Autonoma de Barcelona, Spain
  • fYear
    1996
  • fDate
    11-14 Mar 1996
  • Firstpage
    609
  • Abstract
    Summary form only given. As CMOS VLSI circuits increment, their complexity and specifications become more aggressive, automatic layout generators gain popularity. These tools divide their task into a set of steps that include transistor pairing, chaining, sizing, placement of diffusion strips and routing. In each of these steps a high optimization degree is required in order to achieve good results. Usually, the transistors are placed in two parallel rows, one for the p- and one for the n-transistors. Transistors with the same gate connection are aligned vertically to reduce internal routing. Maintaining this constraint, a chaining algorithm should be able to find a minimum set of transistor chains in order to reduce the number of diffusion gaps, and hence, the overall area. Existing chaining algorithms try to find a minimal number of diffusion chains given a pre-fixed pairing. Therefore, pairs are fixed before the chains are generated, and the chain formation process cannot change those pairs. However, a different pairing can lead to a lower number of diffusion chains. Our main new feature is to combine the paring and chaining steps: the pairing disappears as a separate step and is dynamically generated during the chain formation process. In our approach, the set of all pairs of interest is generated. Not all pairs will be present in the final solution. The bipartite graph is extended to represent the new possible abutments. New incompatibilities must now be taken into account
  • Keywords
    CMOS integrated circuits; VLSI; circuit layout CAD; circuit optimisation; integrated circuit layout; CMOS layout generation; VLSI circuits; automatic layout generators; bipartite graph; chain formation process; combined pairing/chaining algorithm; diffusion gaps; transistor pairing; Bipartite graph; Circuits; Design automation; Laboratories; Routing; Strips; Tree graphs; Upper bound; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1996. ED&TC 96. Proceedings
  • Conference_Location
    Paris
  • ISSN
    1066-1409
  • Print_ISBN
    0-8186-7424-5
  • Type

    conf

  • DOI
    10.1109/EDTC.1996.494373
  • Filename
    494373