DocumentCode :
3442325
Title :
Anomalous photoconductivity variations of solar cell quality a-Si:H thin films induced by proton irradiation
Author :
Sato, Shin-ichiro ; Sai, Hitoshi ; Imaizumi, Mitsuru ; Shimazaki, Kazunori ; Kondo, Michio ; Ohshima, Takeshi
Author_Institution :
Japan Atomic Energy Agency (JAEA), Takasaki, Japan
fYear :
2009
fDate :
7-12 June 2009
Abstract :
We investigated photoconductivity (PC) variations of hydrogenated amorphous silicon (a-Si:H) thin films irradiated with 0.10, 1.0 or 10 MeV protons. As a result, the PC values for all samples once increased and then decreased dramatically. Light-soaking treatment doesn´t affect the anomalous PC increment. In order to obtain the knowledge about the anomalous PC increment, dark current was monitored during and after 10 MeV proton irradiation. Radiation induced conductivity (RIC) and persistent excited conductivity (PEC) were clearly observed during and after the irradiation, respectively. Subsequently, the PC variations with time after 10 MeV proton irradiation at the fluence of 3.0×1013 /cm2 were also investigated. The results showed that the PC value even after 270 hours was over twice higher than that before the irradiation, though the PC values decreased with time. However, the PC value became almost equivalent to the value before the proton irradiation by applying light-soaking. These results indicate that the anomalous PC increment is metastable.
Keywords :
elemental semiconductors; photoconductivity; proton effects; semiconductor thin films; silicon; solar cells; Si:H; a-Si:H thin films; anomalous photoconductivity variations; dark current; electron volt energy 10 MeV; hydrogenated amorphous silicon thin films; light-soaking treatment; proton irradiation; solar cell; time 270 h; Amorphous silicon; Conductivity; Dark current; Metastasis; Monitoring; Photoconductivity; Photovoltaic cells; Protons; Semiconductor thin films; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2009.5411322
Filename :
5411322
Link To Document :
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