Title :
Notice of Retraction
System life prediction approaches based on key apparatus
Author :
Hongyan Zhuo ; Zhiqiang Liu ; Xiao Jin ; Fanbao Meng ; Xiaoyan Hu
Author_Institution :
CAEP, Inst. of Appl. Electron., Mianyang, China
Abstract :
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Life parameter is important for product. It is very important for an engineer to predict system lifetime. Reasonable approaches of system life prediction can cause exact prediction of system life. One approach of system life prediction based on key apparatus is presented to solve the questions of absence of system life data and experiments of system life. By confirming the key apparatus of system which has influence on system life, analyzing life of key apparatus, and conducting accelerated experiments, life value estimated can be obtained. Then, life of system in all can be obtained by using method of accessory minimum life. The approach is valuable of applications and verified with experiments.
Keywords :
life testing; reliability; accessory minimum life; key apparatus; life value estimation; product life parameter; reliability; system life prediction approach; system lifetime prediction; Acceleration; Aging; Maintenance engineering; Material storage; Materials; Reliability engineering; accelerated life experiment; key apparatus; life prediction;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
DOI :
10.1109/QR2MSE.2013.6625934