• DocumentCode
    3442728
  • Title

    A Case Study: Verification of Specifications of an Embedded System and Generation of Verification Items Using Pairwise Testing

  • Author

    Sekizawa, Toshifusa ; Kotorii, Tsugu

  • Author_Institution
    Fac. of Inf., Osaka Gakuin Univ., Suita, Japan
  • Volume
    2
  • fYear
    2013
  • fDate
    2-5 Dec. 2013
  • Firstpage
    146
  • Lastpage
    151
  • Abstract
    Ensuring the reliability of embedded systems has become very important. Reliability may be ensured by a number of formal methods. We study one such verification technique by applying it to an in-house development product in Mitsubishi Space Software Co., Ltd. This is a practical industrial case study, we describe our approaches and present verification results. Our aim is to check the correctness of specifications which include a set of constraints on parameters individually called an evaluation item. To that end, we adopt model checking and satisfiability checking. In our study, we set conversion rules from specifications to formal models. Part of the conversion is done by hand in this study. Manual generation limits the preparation of individual evaluation items. To overcome this limitation we present an approach for automatically generating combinations of parameters for verification by applying the pair wise testing method. Finally, we present experimental results. Note that the application of formal techniques, in this setting, is still in its preliminary stages. It is intended to develop formal techniques to the point where products may be automatically verified.
  • Keywords
    computability; embedded systems; formal specification; formal verification; program testing; software reliability; embedded systems reliability; formal methods; in-house development product; model checking; pairwise testing method; satisfiability checking; specification correctness checking; specification verification; verification item generation; Embedded systems; Model checking; Product development; Radiation detectors; Reliability; case study; embedded system; generation of verification items; model checking; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Engineering Conference (APSEC), 2013 20th Asia-Pacific
  • Conference_Location
    Bangkok
  • ISSN
    1530-1362
  • Print_ISBN
    978-1-4799-2143-0
  • Type

    conf

  • DOI
    10.1109/APSEC.2013.130
  • Filename
    6754369