Title :
Modeling the performance of electrochemical machining process using free pattern search
Author :
Wen, Long ; Gao, Liang ; Zhang, Liping
Author_Institution :
State Key Lab. of Digital Manuf. Equip. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
Electrochemical machining is increasing in importance. It provides an economical and effective way to machine extremely difficult to cut metals and always have a higher machining rate, better surface roughness and control. In this paper, a new predictive approach called Free Pattern Search (FPS) is used to explicitly modeling the performance of electrochemical machining. FPS is based on the expression tree of gene expression programming (GEP) to encode the individuals and express them to a non-determinative tree using a fixed length individual. FPS is inspired by Pattern Search (PS) and Free Search (FS), and it hybrids a scatter manipulator to keep the diversity of the population. Three machining parameters, the feed rate, voltage and flow rate of electrolyte are used as the independent input variables when prediction the material remove rate, surface roughness and over cut. Experiments are conducted to verify the performance of FPS and FPS obtains good results in prediction. The predictive model found by FPS agrees with the experimental results well. The relationships between variables and performance are also showed clearly in the predictive model, and the results shows that they are fit to the experiments well.
Keywords :
electrochemical machining; genetic algorithms; search problems; surface roughness; trees (mathematics); FPS predictive approach; GEP; electrochemical machining process; electrolyte flow rate parameter; expression tree; feed rate parameter; fixed length individual; free pattern search; free search; gene expression programming; machining rate; material remove rate; nondeterminative tree; pattern search; scatter manipulator; surface roughness; voltage parameter; Cognitive informatics; Electrochemical Machining; Expression Tree; Free Pattern Search; Modeling;
Conference_Titel :
Cognitive Informatics & Cognitive Computing (ICCI*CC), 2012 IEEE 11th International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2794-7
DOI :
10.1109/ICCI-CC.2012.6311194