• DocumentCode
    3442914
  • Title

    Universal test-bench for charging/discharging of Ni-Cd and Ni-MH batteries

  • Author

    González, Manuela ; López, Jose ; López, Emilio ; Pérez, Miguel Angel

  • Author_Institution
    Dept. de Ingenieria Electr., Electron. de Comput. y de Sistemas, Oviedo Univ., Spain
  • fYear
    1994
  • fDate
    21-25 Aug 1994
  • Firstpage
    131
  • Lastpage
    137
  • Abstract
    At present, Ni-Cd secondary batteries are the most used batteries in a large number of applications because of their high performance. Ultrafast charging in less than an hour is a very attractive service for users of such batteries, saving time and reducing the need for spares or larger batteries, but this requires a charge control more complex than conventional methods. In order to study how battery performances are modified as a function of the fast-charge method used, a test-bench for Ni-Cd and Ni-MH batteries has been developed. The proposed test-bench allows the realization of all types of charging/discharging tests although its main task is to perform fast-charge tests. Using a computer, a user-friendly program allows the setting of test parameters as well as microcontroller-based test automation. The system stores data from all cycles of the test: battery temperature; current; voltage; and environment temperature, for later dissemination
  • Keywords
    automatic test equipment; automatic testing; battery testers; cadmium; microcomputer applications; nickel; power engineering computing; secondary cells; test facilities; Ni-Cd; Ni-H2; battery current; battery performance; battery temperature; battery voltage; charge control; charging; discharging; environment temperature; fast-charge method; microcontroller; secondary batteries; test automation; universal test-bench; user-friendly program; Batteries; Computer industry; Computerized monitoring; Condition monitoring; Costs; Microcontrollers; Performance evaluation; System testing; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Congress, 1994. Technical Proceedings. CIEP '94., 3rd International
  • Conference_Location
    Puebla
  • Print_ISBN
    0-7803-2068-9
  • Type

    conf

  • DOI
    10.1109/CIEP.1994.494411
  • Filename
    494411