Title :
TLM enhancements for EMC studies
Author :
Johns, D.P. ; Mallik, A. ; Wlosarcyzk, A.J.
Author_Institution :
Kimberley Communications Consultants, Nottingham, UK
Abstract :
The enhancement of the 3-D transmission-line matrix method (TLM) to include electromagnetic field penetration into thin lossy films, interaction with fine wires and coupling through narrow slot apertures is described. The models are tested against theoretical results and fine discretisation TLM models
Keywords :
electromagnetic compatibility; transmission line theory; 3-D transmission-line matrix method; EMC; TLM models; coupling through narrow slot apertures; electromagnetic field penetration; fine wires; thin lossy films; Apertures; Computational modeling; Conductive films; Electromagnetic compatibility; Electromagnetic fields; Propagation losses; Transistors; Transmission line matrix methods; Transmission lines; Wires;
Conference_Titel :
Electromagnetic Compatibility, 1992. From a Unified Region to a Unified World., 1992 Regional Symposium on
Conference_Location :
Tel-Aviv
Print_ISBN :
0-7803-0725-9
DOI :
10.1109/ISEMC.1992.257594
