DocumentCode :
3443366
Title :
Performance assessment of sub-percolating nanobundle network transistors by an analytical model
Author :
Pimparkar, Ninad ; Guo, Jing ; Alam, M.A.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN
fYear :
2005
fDate :
5-5 Dec. 2005
Firstpage :
534
Lastpage :
537
Abstract :
Nanobundle network transistors (NBTs) have emerged as a viable, higher performance alternative to poly-silicon and organic transistors with possible applications in macroelectronic displays, chemical/biological sensors, and photovoltaics. A simple analytical model for I-V characteristics of NBTs (below the percolation limit) is proposed and validated by numerical simulation and experimental data. The physics-based predictive model provides a simple relation between transistor characteristics and design parameters which can be used for optimization of NBTs. The model provides important insights into the recent experiments on NBT characteristics and electrical purification of nanobundle networks
Keywords :
nanoelectronics; organic semiconductors; semiconductor device models; transistors; I-V characteristics; NBT; biological sensors; chemical sensors; electrical purification; macroelectronic displays; nanobundle network transistors; organic transistors; percolation limit; performance assessment; photovoltaics; physics-based predictive model; poly-silicon transistors; Analytical models; Biosensors; Chemical and biological sensors; Design optimization; Displays; Nanobioscience; Numerical simulation; Organic chemicals; Photovoltaic cells; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-9268-X
Type :
conf
DOI :
10.1109/IEDM.2005.1609400
Filename :
1609400
Link To Document :
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