Title :
AlGaInN high power lasers
Author :
Tojyo, T. ; Kijima, Shuji ; Uchida, Seiichi ; Ikeda, Makoto
Abstract :
Summary form only given. AlGaInN high power laser diodes (LDs) were fabricated on a thin epitaxially laterally overgrown GaN (ELO-GaN) substrate. The LD characteristics were improved by using this ELO-GaN substrate. This is because ELO-GaN is quite effective in reducing dislocation density and in forming good cleaved facets. We have improved the characteristics by optimizing the parameters of the ridge stripe; ridge width and the distance between active layer and etched surface adjacent the ridge. We have also improved kink level by introducing a novel ridge stripe structure. The kink level of more than 80 mW was realized by the novel ridge structure. This value is considerably higher by about 30 mW higher than a conventional ridge structure. Consequently, lifetimes of LDs have exceeded 1000 h under 30 mW operation at 60 /spl deg/C.
Keywords :
III-V semiconductors; aluminium compounds; dislocation density; gallium compounds; indium compounds; life testing; optical fabrication; semiconductor lasers; wide band gap semiconductors; 1000 h; 30 mW; 60 C; 80 mW; AlGaInN high power laser diodes; AlGaInN-GaN; GaN; active layer; dislocation density; etched surface; good cleaved facets; kink level; lifetimes; ridge stripe; ridge width; thin epitaxially laterally overgrown GaN substrate; DVD; Diode lasers; Etching; Gallium arsenide; Optical refraction; Optical sensors; Power generation; Power lasers; Threshold current; Voltage;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
DOI :
10.1109/CLEO.2001.947502