Title :
Notice of Retraction
Measurement of ESD protection structure irradiation degradation using TLP method
Author :
Qian Shi ; Qing-Zhong Xiao ; Yuan Liu ; Yun-fei En
Author_Institution :
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., China Electron. Produce Reliability, Guangzhou, China
Abstract :
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Ionization radiation causes ESD protection structure of integrated circuit degradation. A new method using Transmission Line Pulse (TLP) test is introduced in this article; this method gives more detailed information of the ESD protection structure´s degradation. Turn-on voltage, hold voltage, turn-on resistance of two type ESD protection structures are measured before and after TID radiation test, results are discussed.
Keywords :
electrostatic discharge; integrated circuit reliability; integrated circuit testing; ionisation; transmission lines; ESD protection structure irradiation degradation; TID radiation test; TLP method; hold voltage; integrated circuit degradation; ionization radiation; transmission line pulse test; turn-on resistance; turn-on voltage; Degradation; Electrostatic discharges; Integrated circuits; Leakage currents; Power transmission lines; Transmission line measurements; Voltage measurement; ESD; total dose radiation; transmission line pulse;
Conference_Titel :
Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE), 2013 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-1014-4
DOI :
10.1109/QR2MSE.2013.6625980
