DocumentCode :
3443558
Title :
A Local Bus Network with Autonomous Test Ability
Author :
Zheng, Wei ; Chen, Weimin ; Zhang, Peng ; Huang, Xiaowei ; Hu, Shunren
Author_Institution :
Key Lab. for Optoelectron. Technol. & Syst., Chongqing Univ., Chongqing
fYear :
2008
fDate :
12-14 Oct. 2008
Firstpage :
1
Lastpage :
4
Abstract :
This paper introduced a flexible bus concept and established a local test network based on this bus. The test network can be divided into three layers: single device layer, subsystem layer and system layer. The self-diagnosis and self-repair mechanism for the local net was established afterwards. Lastly a nonstop layer-analyzing test strategy was discussed deeply to improve test efficiency. The experiment of a simplified network model for a huge bridge monitoring system showed the efficiency of the method.
Keywords :
embedded systems; system buses; autonomous test ability; bridge monitoring system; embedded system flexible bus; local bus network; local test network; nonstop layer-analyzing test strategy; self-diagnosis mechanism; self-repair mechanism; single device layer; subsystem layer; system layer; Bridges; Control systems; Databases; Educational technology; Embedded system; Laboratories; Logic testing; Monitoring; Space vehicles; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wireless Communications, Networking and Mobile Computing, 2008. WiCOM '08. 4th International Conference on
Conference_Location :
Dalian
Print_ISBN :
978-1-4244-2107-7
Electronic_ISBN :
978-1-4244-2108-4
Type :
conf
DOI :
10.1109/WiCom.2008.1028
Filename :
4678936
Link To Document :
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