Title :
Double-Stacked MoSi2-Barrier Junctions for Programmable Josephson Voltage Standards
Author :
Chong, Y. ; Burroughs, C.J. ; Dresselhaus, P.D. ; Hadacek, N. ; Yamamori, H. ; Benz, S.P.
Author_Institution :
National Inst. of Stand. & Technol., Boulder, CO
Abstract :
We are developing MoSi2-barrier stacked-junction arrays for Josephson voltage standards in order to increase the output voltage, operating bandwidth, and operating margins. In this paper we present measurements of a programmable voltage standard circuit with double-stacked arrays, where two junctions are fabricated in each stack. Although a mask defect prevented operation of one-eighth of the fabricated junctions, the remaining circuit, with a total of 51,344 junctions, succeeded in producing an output of 1.93 V with a range of operating current greater than 1 mA for the combined 13 subarrays
Keywords :
measurement standards; molybdenum compounds; superconducting arrays; superconductor-normal-superconductor devices; voltage measurement; 1.93 V; Josephson voltage standards; MoSi2; mask defect; programmable voltage standard circuit; superconducting arrays; Circuits; Critical current; Electrodes; Josephson junctions; Microwave antenna arrays; Niobium; Sputter etching; Superconducting microwave devices; Voltage; Wiring;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305372