Title :
Flat-Spot Measurements for an Ac Josephson Voltage Standard
Author :
Burroughs, C.J. ; Benz, S.P. ; Dresselhaus, P.D. ; Chong, Y.
Author_Institution :
National Inst. of Stand. & Technol., Boulder, CO
Abstract :
Recent advances in circuit design and fabrication of superconducting integrated circuits have enabled us to demonstrate for the first time an ac Josephson voltage standard (ACJVS) that generates both ac and dc waveforms up to 242 mV peak voltage. Using a FFT (fast Fourier transform) spectrum analyzer and an ac/dc transfer standard, we characterize ACJVS operating margins by performing "flat-spot" measurements at the level of a part in 106 for all eight bias parameters
Keywords :
Josephson effect; fast Fourier transforms; measurement standards; spectral analysers; superconducting integrated circuits; voltage measurement; 242 mV; AC Josephson voltage standard; fast Fourier transforms; flat-spot measurements; integrated circuit design; spectrum analyzers; superconducting integrated circuits; AC generators; Circuit synthesis; DC generators; Fabrication; Fast Fourier transforms; Integrated circuit measurements; Measurement standards; Spectral analysis; Superconducting integrated circuits; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305374
