DocumentCode :
3444185
Title :
Effect of microstructure on the performance of stressed cadmium telluride photovoltaic (PV) devices
Author :
Sampath, W.S. ; Kohli, Sandeep ; Enzenroth, R.A. ; Barth, K.L. ; Manivannan, V. ; Smith ; Kobyakov, P. ; Sathiraju, S. ; McCurdy, Patrick R.
Author_Institution :
Mater. Eng. Lab., Colorado State Univ., Fort Collins, CO, USA
fYear :
2009
fDate :
7-12 June 2009
Abstract :
Our group has demonstrated a commercially viable, continuous, in-line process to fabricate PV devices with efficiencies of 13% on a low iron soda-lime glass (3"×3") with anti-reflection coatings. The process has been extended to large area devices (16"×16" substrate size). In this paper we present our results on the microstructural features of PV devices subjected to stress conditions. The results help to gain insight into the stability and lifetime of CdTe PV modules.
Keywords :
III-VI semiconductors; antireflection coatings; cadmium compounds; crystal microstructure; photovoltaic cells; solar cells; wide band gap semiconductors; CdTe-CdS; antireflection coatings; low iron soda-lime glass; microstructure effect; stressed cadmium telluride photovoltaic devices; Cadmium compounds; Degradation; Microstructure; Photovoltaic cells; Photovoltaic systems; Solar power generation; Stability; Stress; Temperature; Thin film devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2009.5411420
Filename :
5411420
Link To Document :
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