• DocumentCode
    3444426
  • Title

    Aperture scattering effects in oxide confined VCSELs: analytic cavity mode profiles and experimental near-field comparisons

  • Author

    Riyopoulos, S. ; Dialetis, D. ; Liu, J. ; Riely, B. ; Simonis, G. ; Chang, W.

  • Author_Institution
    Sci. Applications Int. Corp., McLean, VA, USA
  • fYear
    2001
  • fDate
    11-11 May 2001
  • Firstpage
    110
  • Lastpage
    111
  • Abstract
    Summary form only given. Microcavities with small features, such as oxide apertures and etched mesa edges, suffer wide angle scattering that cannot be treated by paraxial propagation or by lens-like phase shifts. We present a systematic treatment using the Born approximation in the vector Maxwell equations. The total scattered power and its scaling on the aperture geometry are obtained analytically. For paraxial incoming cavity modes, as is the case in VCSEL cavities, the scattered radiation constitutes a complete loss, of negligible coupling to other paraxial modes.
  • Keywords
    Maxwell equations; laser cavity resonators; laser modes; light scattering; microcavity lasers; surface emitting lasers; Born approximation; S-matrix element; analytic cavity mode profiles; aperture scattering effects; diffraction limited propagation; microcavities; near-field comparisons; optimized Gauss-Laguerre model; oxide confined VCSEL; paraxial incoming cavity modes; step-index waveguide modes; vector Maxwell equations; Apertures; Diffraction; Etching; Gaussian processes; Integrated circuit modeling; Maxwell equations; Noise measurement; Scattering; Threshold current; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    1-55752-662-1
  • Type

    conf

  • DOI
    10.1109/CLEO.2001.947553
  • Filename
    947553