Title :
Aperture scattering effects in oxide confined VCSELs: analytic cavity mode profiles and experimental near-field comparisons
Author :
Riyopoulos, S. ; Dialetis, D. ; Liu, J. ; Riely, B. ; Simonis, G. ; Chang, W.
Author_Institution :
Sci. Applications Int. Corp., McLean, VA, USA
Abstract :
Summary form only given. Microcavities with small features, such as oxide apertures and etched mesa edges, suffer wide angle scattering that cannot be treated by paraxial propagation or by lens-like phase shifts. We present a systematic treatment using the Born approximation in the vector Maxwell equations. The total scattered power and its scaling on the aperture geometry are obtained analytically. For paraxial incoming cavity modes, as is the case in VCSEL cavities, the scattered radiation constitutes a complete loss, of negligible coupling to other paraxial modes.
Keywords :
Maxwell equations; laser cavity resonators; laser modes; light scattering; microcavity lasers; surface emitting lasers; Born approximation; S-matrix element; analytic cavity mode profiles; aperture scattering effects; diffraction limited propagation; microcavities; near-field comparisons; optimized Gauss-Laguerre model; oxide confined VCSEL; paraxial incoming cavity modes; step-index waveguide modes; vector Maxwell equations; Apertures; Diffraction; Etching; Gaussian processes; Integrated circuit modeling; Maxwell equations; Noise measurement; Scattering; Threshold current; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-662-1
DOI :
10.1109/CLEO.2001.947553