DocumentCode
3444426
Title
Aperture scattering effects in oxide confined VCSELs: analytic cavity mode profiles and experimental near-field comparisons
Author
Riyopoulos, S. ; Dialetis, D. ; Liu, J. ; Riely, B. ; Simonis, G. ; Chang, W.
Author_Institution
Sci. Applications Int. Corp., McLean, VA, USA
fYear
2001
fDate
11-11 May 2001
Firstpage
110
Lastpage
111
Abstract
Summary form only given. Microcavities with small features, such as oxide apertures and etched mesa edges, suffer wide angle scattering that cannot be treated by paraxial propagation or by lens-like phase shifts. We present a systematic treatment using the Born approximation in the vector Maxwell equations. The total scattered power and its scaling on the aperture geometry are obtained analytically. For paraxial incoming cavity modes, as is the case in VCSEL cavities, the scattered radiation constitutes a complete loss, of negligible coupling to other paraxial modes.
Keywords
Maxwell equations; laser cavity resonators; laser modes; light scattering; microcavity lasers; surface emitting lasers; Born approximation; S-matrix element; analytic cavity mode profiles; aperture scattering effects; diffraction limited propagation; microcavities; near-field comparisons; optimized Gauss-Laguerre model; oxide confined VCSEL; paraxial incoming cavity modes; step-index waveguide modes; vector Maxwell equations; Apertures; Diffraction; Etching; Gaussian processes; Integrated circuit modeling; Maxwell equations; Noise measurement; Scattering; Threshold current; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2001. CLEO '01. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-662-1
Type
conf
DOI
10.1109/CLEO.2001.947553
Filename
947553
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