DocumentCode
3444491
Title
Migration and oxidation of sulfur at the back contact in CdTe cells
Author
Liu, Xiangxin ; Paudel, Naba R. ; Compaan, Alvin D. ; Sun, Kai ; Weinhardt, Lothar ; Bär, Marcus ; Pookpanratana, Sujitra ; Heske, Clemens ; Fuchs, Oliver ; Yang, Wanli ; Denlinger, Joanthan D.
Author_Institution
Dept. of Phys. & Astron., Univ. of Toledo, Toledo, OH, USA
fYear
2009
fDate
7-12 June 2009
Abstract
In a cross-sectional X-ray energy dispersive spectroscopy mapping study of sputtered CdTe cells, sulfur was found to migrate and accumulate near the back contact. X-ray emission spectra of chloride-treated CdS/CdTe films confirm the accumulation of sulfur at the back surface. A part of the surface sulfur is found to be oxidized in the form of sulfate when Cu is present at the back contact.
Keywords
II-VI semiconductors; X-ray chemical analysis; X-ray emission spectra; cadmium compounds; oxidation; solar cells; sputtered coatings; CdS-CdTe; X-ray emission spectra; cross-sectional X-ray energy dispersive spectroscopy mapping; sputtered cells; sulfate form; sulfur migration; sulfur oxidation; Copper; Degradation; Dispersion; Electrons; Gold; Laboratories; Light sources; Oxidation; Photovoltaic cells; Spectroscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location
Philadelphia, PA
ISSN
0160-8371
Print_ISBN
978-1-4244-2949-3
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2009.5411434
Filename
5411434
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