Title :
Calculating laser diode reliability
Author :
Spencer, James L.
Author_Institution :
Bell Commun. Res., Red Bank, NJ, USA
fDate :
28 Nov-1 Dec 1988
Abstract :
Provides guidelines for calculating laser diode reliability from accelerated life test data. Specific procedures that are used at his company are explained. Example calculations are provided for both wearout and random failure modes. Issues associated with calculating laser module reliability are identified
Keywords :
optical communication; reliability; semiconductor junction lasers; accelerated life test data; laser diode; random failure modes; reliability; wearout; Diode lasers; Fiber lasers; Guidelines; Laser modes; Life estimation; Life testing; Manufacturing; Optical fibers; Telecommunications; Temperature;
Conference_Titel :
Global Telecommunications Conference, 1988, and Exhibition. 'Communications for the Information Age.' Conference Record, GLOBECOM '88., IEEE
Conference_Location :
Hollywood, FL
DOI :
10.1109/GLOCOM.1988.25811
