DocumentCode
3444551
Title
Calculating laser diode reliability
Author
Spencer, James L.
Author_Institution
Bell Commun. Res., Red Bank, NJ, USA
fYear
1988
fDate
28 Nov-1 Dec 1988
Firstpage
63
Abstract
Provides guidelines for calculating laser diode reliability from accelerated life test data. Specific procedures that are used at his company are explained. Example calculations are provided for both wearout and random failure modes. Issues associated with calculating laser module reliability are identified
Keywords
optical communication; reliability; semiconductor junction lasers; accelerated life test data; laser diode; random failure modes; reliability; wearout; Diode lasers; Fiber lasers; Guidelines; Laser modes; Life estimation; Life testing; Manufacturing; Optical fibers; Telecommunications; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Global Telecommunications Conference, 1988, and Exhibition. 'Communications for the Information Age.' Conference Record, GLOBECOM '88., IEEE
Conference_Location
Hollywood, FL
Type
conf
DOI
10.1109/GLOCOM.1988.25811
Filename
25811
Link To Document