Energy storage pulsed power capacitor technology

Author

Laghari, J.R. ; Sarjeant, W.J.

Author_Institution

Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA

fYear

1990

fDate

25-28 Jun 1990

Firstpage

380

Lastpage

386

Abstract

This review addresses fundamentals of dielectric capacitor technology and multifactor stress aging of all classes of insulating media that form elements of this technology. It is directed towards the delineation of failure processes in highly stressed, compact capacitors. Factors affecting the complex aging processes such as thermal, electromechanical, and partial discharges are discussed. Diagnostic measurement techniques available and those being developed to determine material degradation affecting available life and failure probability of capacitors are presented

Keywords

ageing; energy storage devices; failure analysis; partial discharges; power capacitors; probability; pulsed power technology; reliability; testing; aging; diagnosis; dielectric capacitor; energy storage; failure; insulating media; material degradation; measurement; partial discharges; probability; pulsed power capacitor; stress aging; Aging; Capacitance; Ceramics; Dielectric constant; Dielectrics and electrical insulation; Energy storage; Permittivity; Power capacitors; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Sources Symposium, 1990., Proceedings of the 34th International

Conference_Location

Cherry Hill, NJ

Print_ISBN

0-87942-604-7

Type

conf

DOI

10.1109/IPSS.1990.145870

Filename

145870