Title :
Energy storage pulsed power capacitor technology
Author :
Laghari, J.R. ; Sarjeant, W.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
Abstract :
This review addresses fundamentals of dielectric capacitor technology and multifactor stress aging of all classes of insulating media that form elements of this technology. It is directed towards the delineation of failure processes in highly stressed, compact capacitors. Factors affecting the complex aging processes such as thermal, electromechanical, and partial discharges are discussed. Diagnostic measurement techniques available and those being developed to determine material degradation affecting available life and failure probability of capacitors are presented
Keywords :
ageing; energy storage devices; failure analysis; partial discharges; power capacitors; probability; pulsed power technology; reliability; testing; aging; diagnosis; dielectric capacitor; energy storage; failure; insulating media; material degradation; measurement; partial discharges; probability; pulsed power capacitor; stress aging; Aging; Capacitance; Ceramics; Dielectric constant; Dielectrics and electrical insulation; Energy storage; Permittivity; Power capacitors; Stress; Voltage;
Conference_Titel :
Power Sources Symposium, 1990., Proceedings of the 34th International
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-87942-604-7
DOI :
10.1109/IPSS.1990.145870
