Title :
Effect of structure and morphology on thermal and electrical properties of polycarbonate film capacitors
Author :
Yen, S.-P.S. ; Lewis, C.R.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Research is reported to identify polycarbonate (PC) film characteristics and fabrication procedures which extend the reliable performance range of PC capacitors to 125°C without derating, and establish quality control techniques and transfer technology to US PC film manufacturers. The approach chosen to solve these problems was to develop techniques for fabricating biaxially oriented (BX) 2 μm or thinner PC film with a low dissipation factor up to 140°C; isotropic dimensional stability; high crystallinity; and high voltage breakdown strength. The PC film structure and morphology was then correlated to thermal and electrical capacitor behavior. Analytical techniques were developed to monitor film quality during capacitor fabrication, and as a result, excellent performance was demonstrated during initial capacitor testing
Keywords :
manufacturing processes; polymers; power capacitors; quality control; reliability; technology transfer; 125 degC; 2 micron; crystallinity; dissipation factor; electrical properties; fabrication; isotropic dimensional stability; morphology; performance; polycarbonate film capacitors; power capacitors; quality control; reliability; structure; technology transfer; testing; thermal properties; voltage breakdown strength; Capacitors; Crystallization; Dielectric breakdown; Fabrication; Manufacturing; Monitoring; Morphology; Performance analysis; Quality control; Stability;
Conference_Titel :
Power Sources Symposium, 1990., Proceedings of the 34th International
Conference_Location :
Cherry Hill, NJ
Print_ISBN :
0-87942-604-7
DOI :
10.1109/IPSS.1990.145871
