Title :
Direct Resistance Comparisons from the QHR to 100 Megohm using a Cryogemic Current Comparator
Author :
Elmquist, R. ; Hourdakis, E. ; Jarrett, D. ; Zimmerman, N.
Author_Institution :
National Inst. of Stand. & Technol., Gaithersburg, MD
Abstract :
We describe the operation of a cryogenic current comparator (CCC) bridge that attains high current sensitivity while maintaining stability under a range of measurement conditions. Measurements of 100 MCI standard resistors and cryogenic thin-film resistors have been made at low voltage levels, based directly on a quantized Hall resistance (QHR) standard
Keywords :
bridge instruments; cryogenic electronics; current comparators; electric resistance measurement; quantum Hall effect; thin film resistors; MCI standard resistors; cryogenic current comparator; cryogenic thin-film resistors; quantized Hall resistance; Bridge circuits; Cryogenics; Current measurement; Electrical resistance measurement; Frequency; Measurement standards; Noise level; Resistors; SQUIDs; Superconducting device noise;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305459
