Title :
Thermal expansion of alpha quartz
Author :
Kosinski, J.A. ; Gualtieri, J.G. ; Ballato, A.
Author_Institution :
US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ, USA
Abstract :
Existing data for thermal expansion of alpha quartz (between -50°C and 150°C) have been critically analyzed. A recommended best set of values was received, as were third-, and fourth-, and fifth-order power series expansions for the coefficients of thermal linear expansion (CTE), referenced to 0°C. To fully utilize the results, relationships between the CTEs and the thermal expansion coefficients (αij) were derived and αij referenced to 25°C were obtained. Based on the results, an additional analysis to third order in αij values allow direct comparison with previously published thermal expansion coefficients. The influence of the new αij on determinations of quartz material temperature coefficients and on the calculation of temperature coefficients of frequency for the case of the AT-cut are discussed
Keywords :
crystal resonators; frequency stability; quartz; thermal expansion; -50 to 150 C; AT-cut; CTE; SiO2 crystal; alpha quartz; calculation; coefficients of thermal linear expansion; fifth-order power series expansions; fourth order power series expansions; quartz material temperature coefficients; temperature coefficients of frequency; thermal expansion; thermal expansion coefficients; third order power series expansions; Crystalline materials; Data analysis; Electronics industry; Frequency; Laboratories; Materials reliability; Performance analysis; Piezoelectric materials; Temperature distribution; Thermal expansion;
Conference_Titel :
Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-87942-658-6
DOI :
10.1109/FREQ.1991.145883
