Title :
Influence of terrestrial cosmic rays on the reliability of CCD image sensors
Author :
Theuwissen, Albert J P
Abstract :
An aging effect in solid-state image sensors is studied: the generation of hard errors resulting in hot spots or white pixels. These effects even occur in sensors that are stored on the shelf. This paper describes experiments that are conducted to prove that the main origin can be found with neutrons that are part of terrestrial cosmic rays
Keywords :
CCD image sensors; cosmic rays; radiation effects; semiconductor device reliability; CCD image sensors; aging effect; hard errors; hot spots; neutrons; solid-state image sensors; terrestrial cosmic rays; white pixels; Area measurement; Charge-coupled image sensors; Cosmic rays; Gain measurement; Image generation; Image sensors; Image storage; Pixel; Sea measurements; Time measurement;
Conference_Titel :
Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-9268-X
DOI :
10.1109/IEDM.2005.1609479
