DocumentCode
3444987
Title
MOSAIC V-a very high performance bipolar technology
Author
Torre, V. Dela ; Foerstner, J. ; Lojek, B. ; Sakamoto, K. ; Sundaram, S.L. ; Tracht, N. ; Vasquez, B. ; Zdebel, P.
Author_Institution
Motorola Inc., Mesa, AZ, USA
fYear
1991
fDate
9-10 Sep 1991
Firstpage
21
Lastpage
24
Abstract
The authors describe the initial implementation of MOSAIC V (Motorola oxide isolated self-aligned implanted circuits, fifth generation), a novel silicon process technology. A number of innovative process approaches and novel methods of aggressive device scaling result in deep submicron device structures in the range of 0.1-0.4 μm. A very low speed-power product of 92 fJ at 3.3-V supply voltage for ECL (emitter coupled logic) gates is obtained in the lower range of operating currents, with typical gate delays of 73 ps at 100 μA and 35 ps at 800 μA switch currents. Using a selectively implanted collector, a minimum ECL gate delay of 29 ps at 800 μA switch current is achievable
Keywords
bipolar integrated circuits; delays; emitter-coupled logic; integrated circuit technology; integrated logic circuits; 0.1 to 0.4 micron; 100 to 800 muA; 29 to 73 ps; 33 V; ECL gate delay; MOSAIC V; Motorola; Si; deep submicron device structures; device scaling; emitter coupled logic; fifth generation; high performance bipolar technology; implanted circuits; monolithic IC; oxide isolated; selectively implanted collector; self-aligned; Capacitance; Delay; Electrodes; Isolation technology; Plugs; Silicon carbide; Space technology; Substrates; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Bipolar Circuits and Technology Meeting, 1991., Proceedings of the 1991
Conference_Location
Minneapolis, MN
Print_ISBN
0-7803-0103-X
Type
conf
DOI
10.1109/BIPOL.1991.160948
Filename
160948
Link To Document