DocumentCode :
3445001
Title :
The aging of bulk acoustic wave resonators, filters and oscillators
Author :
Vig, John R. ; Meeker, Thrygve R.
Author_Institution :
US Army Electron. Technol. & Devices Lab., Fort Monmouth, NJ, USA
fYear :
1991
fDate :
29-31 May 1991
Firstpage :
77
Lastpage :
101
Abstract :
The aging of quartz crystal resonators, filters, and oscillators is reviewed, including such topics as the impacts of aging, typical aging characteristics, aging specifications, aging mechanisms, temperature dependence of aging, frequency and overtone dependence of aging, drive level dependence of aging, the effects of aging interruptions, the dependence of aging on material and mode type, state-of-the-art in low-aging oscillators, and aging acceleration effects. The aging mechanisms discussed include contamination transfer effects, stress effects, electrode effects, diffusion effects, changes in the quartz material, and circuit and other electrical changes. Isothermal and thermal step stress aging acceleration methods are reviewed
Keywords :
ageing; crystal resonators; filters; frequency stability; oscillators; quartz; SiO2 crystal resonators; aging; aging acceleration effects; aging characteristics; aging interruptions; aging mechanisms; aging specifications; bulk acoustic wave resonators; contamination transfer effects; crystal cuts; diffusion effects; drive level dependence; electrode effects; filters; frequency aging; frequency dependence; isothermal stress aging acceleration methods; long term aging; low-aging oscillators; material dependence; mode type dependence; oscillators; overtone dependence; quartz crystal resonators; stress effects; temperature dependence; thermal step stress aging acceleration methods; Accelerated aging; Acoustic waves; Contamination; Crystalline materials; Electrodes; Frequency; Oscillators; Resonator filters; Temperature dependence; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
Conference_Location :
Los Angeles, CA
Print_ISBN :
0-87942-658-6
Type :
conf
DOI :
10.1109/FREQ.1991.145888
Filename :
145888
Link To Document :
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