Title : 
Suppression of the unwanted response of an SC-cut crystal unit
         
        
            Author : 
Koyama, N. ; Mizuno, Seiya ; Okazaki, M.
         
        
            Author_Institution : 
Nihon Dempa Kogyo Co. Ltd., Saitama, Japan
         
        
        
        
        
        
            Abstract : 
Research on the radius of curvature of plano-convex crystal wafers and the beveling operation for the purpose of suppressing the unwanted response of the 3rd overtone 5-MHz SC-cut crystal units to be used in an OCXO (oven-controlled crystal oscillator) is discussed. An SC-cut crystal unit whose unwanted responses are suppressed has superior frequency temperature characteristics, free from activity dips. Measurement of the equivalent circuit parameter revealed that the Q  value is 2.14×106, the capacitance ratio is 1.78×104, the equivalent resistance is 80 Ω and the motional inductance is 5.5 H. The OCXO using an SC-cut crystal unit whose unwanted responses are suppressed, has a phase noise of -105 dBc/Hz in terms of 1-Hz offset frequency from the carrier. Thermal hysteresis and the orientation effect of frequency are on the order of 10-10, while the aging rate is 2×10-9
         
        
            Keywords : 
crystal resonators; oscillators; quartz; 3rd overtone; 5 MHz; 80 ohm; OCXO; Q-factor; SC-cut crystal unit; activity dips elimination; aging rate; beveling operation; capacitance ratio; equivalent circuit; equivalent resistance; frequency temperature characteristics; motional inductance; orientation effect; oven-controlled crystal oscillator; phase noise; plano-convex crystal wafers; radius of curvature; spurious response suppression; thermal hysteresis; Capacitance measurement; Electrical resistance measurement; Equivalent circuits; Frequency measurement; Inductance measurement; Noise measurement; Oscillators; Phase measurement; Q measurement; Temperature;
         
        
        
        
            Conference_Titel : 
Frequency Control, 1991., Proceedings of the 45th Annual Symposium on
         
        
            Conference_Location : 
Los Angeles, CA
         
        
            Print_ISBN : 
0-87942-658-6
         
        
        
            DOI : 
10.1109/FREQ.1991.145893