Title :
Present Status of the a Vogadro Constant Determination from Silicon Crystals with Natural Isotopic Composition
Author :
Fujii, K. ; Waseda, A. ; Kuramoto, N. ; Mizushima, S. ; Becker, P. ; Bettin, H. ; Nicolaus, A. ; Kuetgens, U. ; Valkiers, S. ; Taylor, P. ; De Bièvre, P. ; Mana, G. ; Massa, E. ; Matyi, R.
Author_Institution :
Nat. Metrol. Inst. of Japan, Ibaraki
Abstract :
The determination of the Avogadro constant from two selected silicon crystals is described. The density, molar mass, and lattice spacing of the two crystals were measured at NMU, PTB, IRMM, IMGC, and NIST. When all the data are combined, it leads to the Avogadro constant of 6.022 1353 (21) times 1023 mol-1 with a relative combined standard uncertainty of 3.4 times 10-7
Keywords :
lattice constants; silicon; Avogadro constant determination; Si; natural isotopic composition; relative combined standard uncertainty; silicon crystals; Composite materials; Covariance matrix; Crystals; Density measurement; Lattices; Least squares approximation; Metrology; NIST; Pressure measurement; Silicon;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305501
