• DocumentCode
    3445381
  • Title

    Toward metamorphic multijunction GaAsP/Si photovoltaics grown on optimized GaP/Si virtual substrates using anion-graded GaAsyP1-y buffers

  • Author

    Grassman, T.J. ; Brenner, M.R. ; Carlin, A.M. ; Rajagopalan, S. ; Unocic, R. ; Dehoff, R. ; Mills, M. ; Fraser, H. ; Ringel, S.A.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    Using migration enhanced epitaxy nucleation followed by molecular beam epitaxy bulk growth on pristine, intentionally offcut Si(001) substrates, we have produced high-quality GaP/Si virtual substrates, successfully demonstrating full control and elimination of heterovalent nucleation-related defects (antiphase domains, stacking faults, and microtwins). These virtual substrates provide a pathway to direct integration of III-V photovoltaic materials and devices on Si substrates. Prototype GaAsP solar cell test devices grown on anion-sublattice step-graded GaAsyP1-y buffers on early-stage GaP/Si substrates show good preliminary performance characteristics and offer great promise for future devices integrated with the newly-developed defect-free GaP/Si virtual substrates.
  • Keywords
    III-V semiconductors; arsenic compounds; buffer layers; gallium arsenide; gallium compounds; molecular beam epitaxial growth; nucleation; silicon; solar cells; stacking faults; substrates; GaAsP-Si; GaP-Si; III-V photovoltaic materials; anion-graded buffers; antiphase domains; epitaxy nucleation; heterovalent nucleation; metamorphic multijunction photovoltaics; microtwins; molecular beam epitaxy bulk growth; optimized virtual substrates; pristine; solar cell; stacking faults; Coatings; Fresnel reflection; Gallium arsenide; III-V semiconductor materials; Optical reflection; Optical refraction; Optical surface waves; Photovoltaic cells; Ray tracing; Solar energy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411489
  • Filename
    5411489