• DocumentCode
    3445480
  • Title

    Atmospheric-pressure plasma deposition of indium tin oxide

  • Author

    Johnson, K. ; Guruvenket, S. ; Jha, S. ; Halverson, B. ; Olson, C. ; Sailer, R.A. ; Pokhodnya, K. ; Schulz, D.L.

  • Author_Institution
    Center for Surface Protection - Hard Coatings, North Dakota State Univ., Fargo, ND, USA
  • fYear
    2009
  • fDate
    7-12 June 2009
  • Abstract
    Indium tin oxide (ITO) films were deposited via atmospheric-pressure plasma-enhanced chemical vapor deposition (APPD) using indium acetylacetonate, indium trifluoroacetylacetonate and tin trifluoroacetylacetonate as metal-organic precursors. A film growth temperature of 300°C gave highly-transparent films with modest conductivity. Post-deposition thermal treatments gave ITO films with resistivities one to two orders of magnitude higher than those available commercially. Compositional analysis revealed a high carbon content and annealing the films in oxygen at 400 C did not affect the C concentration. A decrease in the fluorine content in the films was observed after annealing with and the onset of crystallization was noted via XRD.
  • Keywords
    X-ray diffraction; annealing; atmospheric pressure; crystallisation; indium compounds; organic compounds; plasma CVD; semiconductor thin films; tin compounds; ITO; XRD; annealing; atmospheric-pressure plasma deposition; crystallization; indium acetylacetonate; indium tin oxide films; indium trifluoroacetylacetonate; metal organic precursors; plasma enhanced chemical vapor deposition; temperature 300 degC; temperature 400 degC; thermal treatments; thin film growth; tin trifluoroacetylacetonate; Annealing; Atmospheric-pressure plasmas; Chemical vapor deposition; Conductive films; Conductivity; Indium tin oxide; Plasma applications; Plasma chemistry; Plasma temperature; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
  • Conference_Location
    Philadelphia, PA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-2949-3
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2009.5411492
  • Filename
    5411492