Title :
Investigations of Noise in Measurements of Electronic Voltage Standards
Author :
Witt, Thomas J. ; Tang, Yi-hua
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres
Abstract :
We have studied the voltage noise of electronic voltage standards based on Zener diode references (Zeners). Ten volt Zener outputs were compared to NIST Josephson standards using a digital voltmeter (DVM) to record voltage differences. The data were analyzed using the Allan variance. We have characterized the 1/f noise of 22 Zeners of three types. We also present evidence for the presence of a high level of white noise in Zeners
Keywords :
1/f noise; Zener diodes; measurement standards; voltage measurement; white noise; 1f noise; Allan variance; Josephson standards; Zener diode references; digital voltmeter; electronic voltage standards; voltage noise; white noise; Data acquisition; Instruments; Laboratories; Light emitting diodes; Measurement standards; NIST; Noise measurement; Testing; Voltage measurement; Voltmeters;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305516
