DocumentCode
3445498
Title
Investigations of Noise in Measurements of Electronic Voltage Standards
Author
Witt, Thomas J. ; Tang, Yi-hua
Author_Institution
Bur. Int. des Poids et Mesures, Sevres
fYear
2004
fDate
38139
Firstpage
172
Lastpage
173
Abstract
We have studied the voltage noise of electronic voltage standards based on Zener diode references (Zeners). Ten volt Zener outputs were compared to NIST Josephson standards using a digital voltmeter (DVM) to record voltage differences. The data were analyzed using the Allan variance. We have characterized the 1/f noise of 22 Zeners of three types. We also present evidence for the presence of a high level of white noise in Zeners
Keywords
1/f noise; Zener diodes; measurement standards; voltage measurement; white noise; 1f noise; Allan variance; Josephson standards; Zener diode references; digital voltmeter; electronic voltage standards; voltage noise; white noise; Data acquisition; Instruments; Laboratories; Light emitting diodes; Measurement standards; NIST; Noise measurement; Testing; Voltage measurement; Voltmeters;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location
London
Print_ISBN
0-7803-8494-6
Electronic_ISBN
0-7803-8494-6
Type
conf
DOI
10.1109/CPEM.2004.305516
Filename
4097171
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