• DocumentCode
    3445579
  • Title

    Robust facial feature localization with probabilistic constrained local models

  • Author

    Lei Wei ; Wei Gao ; Yehu Shen ; Yi Zhu ; Rui Mo ; Zhenyun Peng ; Yaohui Zhang

  • Author_Institution
    Div. of Syst. Integration & IC Design, Inst. of Nano-tech & Nano-bionics, Suzhou, China
  • fYear
    2012
  • fDate
    16-18 Oct. 2012
  • Firstpage
    480
  • Lastpage
    484
  • Abstract
    Constrained local models (CLMs) recently exhibit superior generic performance in facial feature localization over leading holistic gradient descent methods, such as active appearance models (AAMs). However, due to representing shape variations with a single deterministic PCA (Principal Component Analysis) model, canonical CLMs may suffer inherent drawbacks when applied to faces with large non-rigid shape variations. To solve the problem, this paper presents a probabilistic constrained local model (PCLM) via introducing probabilistic concepts into the canonical CLM framework. The PCLM consists of an ensemble of patch experts estimating likelihood of multiple candidate positions for each facial landmark, and a shape prior model based on mixtures of probabilistic principal component analyzers (MPPCA). The shape and pose parameters of the model are estimated using the expectation-maximization (EM) algorithm within a maximum-likelihood framework. Experimental results prove that the proposed PCLM is capable of dealing with face images of large non-rigid shape variations and noises.
  • Keywords
    expectation-maximisation algorithm; face recognition; gradient methods; image representation; principal component analysis; probability; AAM; CLM; EM; MPPCA; PCLM; active appearance model; canonical CLM framework; expectation-maximization algorithm; face recognition; facial landmark; holistic gradient descent method; mixtures of probabilistic principal component analyzer; nonrigid shape variation; patch expert maximum likelihood estimation; pose parameter; probabilistic constrained local model; robust facial feature localization; shape parameter; shape prior model; single deterministic PCA model; Active appearance model; Analytical models; Facial features; Probabilistic logic; Shape; Support vector machines; Vectors; CLM; EM; PPCA; SVM; face alignment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Signal Processing (CISP), 2012 5th International Congress on
  • Conference_Location
    Chongqing
  • Print_ISBN
    978-1-4673-0965-3
  • Type

    conf

  • DOI
    10.1109/CISP.2012.6469822
  • Filename
    6469822