DocumentCode :
3445579
Title :
Robust facial feature localization with probabilistic constrained local models
Author :
Lei Wei ; Wei Gao ; Yehu Shen ; Yi Zhu ; Rui Mo ; Zhenyun Peng ; Yaohui Zhang
Author_Institution :
Div. of Syst. Integration & IC Design, Inst. of Nano-tech & Nano-bionics, Suzhou, China
fYear :
2012
fDate :
16-18 Oct. 2012
Firstpage :
480
Lastpage :
484
Abstract :
Constrained local models (CLMs) recently exhibit superior generic performance in facial feature localization over leading holistic gradient descent methods, such as active appearance models (AAMs). However, due to representing shape variations with a single deterministic PCA (Principal Component Analysis) model, canonical CLMs may suffer inherent drawbacks when applied to faces with large non-rigid shape variations. To solve the problem, this paper presents a probabilistic constrained local model (PCLM) via introducing probabilistic concepts into the canonical CLM framework. The PCLM consists of an ensemble of patch experts estimating likelihood of multiple candidate positions for each facial landmark, and a shape prior model based on mixtures of probabilistic principal component analyzers (MPPCA). The shape and pose parameters of the model are estimated using the expectation-maximization (EM) algorithm within a maximum-likelihood framework. Experimental results prove that the proposed PCLM is capable of dealing with face images of large non-rigid shape variations and noises.
Keywords :
expectation-maximisation algorithm; face recognition; gradient methods; image representation; principal component analysis; probability; AAM; CLM; EM; MPPCA; PCLM; active appearance model; canonical CLM framework; expectation-maximization algorithm; face recognition; facial landmark; holistic gradient descent method; mixtures of probabilistic principal component analyzer; nonrigid shape variation; patch expert maximum likelihood estimation; pose parameter; probabilistic constrained local model; robust facial feature localization; shape parameter; shape prior model; single deterministic PCA model; Active appearance model; Analytical models; Facial features; Probabilistic logic; Shape; Support vector machines; Vectors; CLM; EM; PPCA; SVM; face alignment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image and Signal Processing (CISP), 2012 5th International Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4673-0965-3
Type :
conf
DOI :
10.1109/CISP.2012.6469822
Filename :
6469822
Link To Document :
بازگشت