DocumentCode
3445621
Title
Accelerated stress testing of hydrocarbon-based encapsulants for medium-concentration CPV applications
Author
Kempe, M.D. ; Kilkenny, M. ; Moricone, T.J. ; Zhang, J.Z.
Author_Institution
Nat. Renewable Energy Lab. (NREL), Golden, CO, USA
fYear
2009
fDate
7-12 June 2009
Abstract
Concentrating photovoltaic (CPV) systems have great potential to reduce photovoltaic (PV) electricity costs because of the relatively low cost of optical components as compared to PV cells. A transparent polymeric material is used to optically couple the PV cell to optical components and is thus exposed to the concentrated light source at elevated temperatures. In this work polymeric encapsulant materials are positioned close to a xenon arc lamp to expose them to ultraviolet radiation (UV) that is about 42 times as intense as sunlight. Furthermore, different glass types are used as filters to modify the spectral distribution of light in the UV range. A strong sensitivity of non-silicone-based encapsulants to light below ~350 nm is demonstrated. Of all the materials examined in this study, the polydimethyl silicone samples performed the best. The next best material was an ionomer which maintained optical transmission but became photo-oxidized where exposed to the atmosphere.
Keywords
arc lamps; light transmission; optical elements; polymers; solar cells; ultraviolet radiation effects; xenon; Xe; accelerated stress testing; concentrated light source; concentrating photovoltaic systems; hydrocarbon based encapsulants; nonsilicone based encapsulants; optical components; optical transmission; photovoltaic electricity costs; polydimethyl silicone; polymeric encapsulant materials; spectral distribution; transparent polymeric material; ultraviolet radiation; xenon arc lamp; Costs; Life estimation; Optical devices; Optical filters; Optical materials; Optical polymers; Photovoltaic systems; Solar power generation; Stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location
Philadelphia, PA
ISSN
0160-8371
Print_ISBN
978-1-4244-2949-3
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2009.5411508
Filename
5411508
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