DocumentCode
3445828
Title
Stability-Degradation Factors in an Optical-Microwave Frequency Link System and their Evaluation using Phase Noise Measurement
Author
Inaba, H. ; Yanagimachi, S. ; Hong, F.-L. ; Onae, A. ; Koga, Y. ; Matsumoto, H. ; Yamadori, S. ; Tohyama, O. ; Yamaguchi, S.
Author_Institution
National Metrol. Inst. of Japan, National Inst. of Adv. Ind. Sci. & Technol., Tsukuba
fYear
2004
fDate
38139
Firstpage
206
Lastpage
207
Abstract
We are developing a highly stable optical-microwave frequency link system. We consider the stability-degradation factors in the frequency link system to be the synthesis, the phase lock and the photo detection system of the repetition frequency. We evaluated these factors by undertaking phase noise measurements
Keywords
electric noise measurement; frequency measurement; frequency stability; phase noise; photodetectors; optical-microwave frequency link system; phase lock system; phase noise measurement; photo detection system; stability-degradation factors; Frequency measurement; Laser mode locking; Noise measurement; Optical noise; Optical pumping; Optical sensors; Phase measurement; Phase noise; Stability; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location
London
Print_ISBN
0-7803-8494-6
Electronic_ISBN
0-7803-8494-6
Type
conf
DOI
10.1109/CPEM.2004.305533
Filename
4097188
Link To Document