Title :
Stability-Degradation Factors in an Optical-Microwave Frequency Link System and their Evaluation using Phase Noise Measurement
Author :
Inaba, H. ; Yanagimachi, S. ; Hong, F.-L. ; Onae, A. ; Koga, Y. ; Matsumoto, H. ; Yamadori, S. ; Tohyama, O. ; Yamaguchi, S.
Author_Institution :
National Metrol. Inst. of Japan, National Inst. of Adv. Ind. Sci. & Technol., Tsukuba
Abstract :
We are developing a highly stable optical-microwave frequency link system. We consider the stability-degradation factors in the frequency link system to be the synthesis, the phase lock and the photo detection system of the repetition frequency. We evaluated these factors by undertaking phase noise measurements
Keywords :
electric noise measurement; frequency measurement; frequency stability; phase noise; photodetectors; optical-microwave frequency link system; phase lock system; phase noise measurement; photo detection system; stability-degradation factors; Frequency measurement; Laser mode locking; Noise measurement; Optical noise; Optical pumping; Optical sensors; Phase measurement; Phase noise; Stability; Ultrafast optics;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305533
