• DocumentCode
    3445991
  • Title

    A new di/dt control gate drive circuit for IGBTs to reduce EMI noise and switching losses

  • Author

    Takizawa, Satoki ; Igarashi, Seiki ; Kuroki, Kazuo

  • Author_Institution
    Fuji Electr. Corp. Res. & Dev. Ltd., Tokyo, Japan
  • Volume
    2
  • fYear
    1998
  • fDate
    17-22 May 1998
  • Firstpage
    1443
  • Abstract
    In this paper, a new di/dt control gate drive circuit for IGBT devices is proposed. By this circuit, the switching performances of IGBT such as dv/dt, di/dt, surge voltage and also switching losses are reduced. This scheme can also eliminate a snubber circuit from the inverter system. From experimental tests, the EMI noise level is reduced by more than 15 dBuV/m as compared with conventional systems
  • Keywords
    driver circuits; equivalent circuits; insulated gate bipolar transistors; power bipolar transistors; switching circuits; EMI noise level; IGBT devices; di/dt control gate drive circuit; dv/dt; inverter system; snubber circuit elimination; surge voltage; switching losses; switching performance; Circuit testing; Electromagnetic interference; Insulated gate bipolar transistors; Inverters; Snubbers; Surges; Switching circuits; Switching loss; System testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 1998. PESC 98 Record. 29th Annual IEEE
  • Conference_Location
    Fukuoka
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-4489-8
  • Type

    conf

  • DOI
    10.1109/PESC.1998.703241
  • Filename
    703241