Title :
System for high accuracy internal quantum efficiency measurement
Author :
Ciocan, R. ; Li, Z. ; Feldman, A. ; Donohue, J.
Author_Institution :
Oriel Instrum., Newport Corp., Stratford, CT, USA
Abstract :
We developed a system that evaluates simultaneously the spectral dependence of quantum efficiency (QE) and internal quantum efficiency (IQE) without the need of additionally moving the sample under investigation during the measurement. The system meets all requirements of ASTM 1021 and exceeds the standard requirements by performing I-V measurements for each wavelength, ¿, along with the possibility to investigate the temperature dependence of QE, IQE and short circuit current, Isc. The system is fully PC controlled, thus allowing PC controlled conditions of white light, DC biasing and temperature. The temperature can span the range 10 - 45°C. The compact design of the light delivery module provides capability for the system to obtain QE, IQE or Isc maps. The full width at half maximum for the beam was determined to be 495 microns. The system can provide 1 nm spectral resolution. The analysis of IQE versus wavelength (¿) curves we obtained (uncertainty in measurement ± 0.7 %) demonstrates that the system presented in this paper is suitable for determining the key parameters for the quantification of minority carrier recombination rate in solar cells.
Keywords :
electric variables measurement; electron-hole recombination; solar cells; ASTM 1021; DC biasing; I-V measurements; internal quantum efficiency measurement; light delivery module; minority carrier recombination rate; short circuit current; solar cells; spectral dependent quantum efficiency; temperature 10 degC to 45 degC; white light; Control systems; Current measurement; Lighting control; Measurement standards; Performance evaluation; Short circuit currents; Temperature control; Temperature dependence; Temperature distribution; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2009.5411538