Title :
Yield enhancement for solar cell manufacturing using resonance Ultrasonic vibrations inspection
Author :
Belyaev, A. ; Emirov, Yu ; Ostapenko, S. ; Tarasov, I. ; Verstraten, V. ; Van Dooren, M. ; Fumei, P.G. ; Van Veghel, G. ; Bentz, P. ; Van Der Heide, A.
Author_Institution :
Ultrasonic Technol. Inc., Tampa, FL, USA
Abstract :
Resonance Ultrasonic vibrations (RUV) methodology was developed and applied to access mechanical quality of crystalline silicon wafers and solar cells. RUV approach is based on fast non-destructive measurement of specific resonance vibration mode generated in the tested object using external ultrasonic transducer. Crack introduced into the object alters the resonance properties of the mode and allows sensitive diagnostics of the crack appearance. The paper describes our recent results of applying RUV method at industrial environment with objective to reduce a breakage rate in solar cell and solar module lines.
Keywords :
electrical products industry; inspection; solar cells; ultrasonic materials testing; ultrasonic transducers; breakage rate; crack appearance; crystalline silicon wafers; fast nondestructive measurement; mechanical quality; resonance properties; resonance ultrasonic vibrations inspection; resonance vibration mode; solar cell manufacturing; solar module lines; ultrasonic transducer; yield enhancement; Crystallization; Inspection; Manufacturing; Nondestructive testing; Photovoltaic cells; Resonance; Silicon; Solar power generation; Ultrasonic variables measurement; Vibration measurement;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2009.5411565
