Title :
Effects of Device Mounting on AC Quantized Hall Resistance Steps
Author :
Ricketts, B.W. ; Fiander, J.R. ; Johnson, H.L.
Author_Institution :
National Meas. Lab., CSIRO, Linfield, NSW
Abstract :
Since the previously reported four-port measurements of quantized Hall resistances (QHRs) at the National Measurement Laboratory (NML) some modifications in the device mounting have resulted in changes in the nature of the i = 2 QHR step
Keywords :
electric resistance measurement; quantum Hall effect; AC quantized Hall resistance steps; National Measurement Laboratory; device mounting; Bridge circuits; Coaxial cables; Conductors; Connectors; Electrical resistance measurement; Laboratories; Metallization; Printed circuits; Probes; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2004 Conference on
Conference_Location :
London
Print_ISBN :
0-7803-8494-6
Electronic_ISBN :
0-7803-8494-6
DOI :
10.1109/CPEM.2004.305571
