DocumentCode :
3446787
Title :
Acoustic microscopy-an industrial view
Author :
Kessler, Lawrance W.
Author_Institution :
Sonoscan Inc., Bensenville, IL, USA
fYear :
1988
fDate :
2-5 Oct 1988
Firstpage :
725
Abstract :
The author describes the three different acoustic-microscopy methods: scanning laser acoustic microscopy (SLAM), scanning acoustic microscopy (SAM), and modernized high-resolution C-scan systems. He then illustrates their respective zones of application within samples. It is concluded that each of the techniques has many noncompeting applications in the fields of nondestructive testing materials characterization, electronic component inspection, and biomedical research
Keywords :
acoustic microscopy; SAM; SLAM; acoustic-microscopy; biomedical research; electronic component inspection; high-resolution C-scan; materials characterization; nondestructive testing; scanning acoustic microscopy; scanning laser acoustic microscopy; Biological materials; Biomedical acoustics; Biomedical materials; Electronic components; Inspection; Laser modes; Microscopy; Nondestructive testing; Optical materials; Simultaneous localization and mapping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1988. Proceedings., IEEE 1988
Conference_Location :
Chicago, IL
Type :
conf
DOI :
10.1109/ULTSYM.1988.49473
Filename :
49473
Link To Document :
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