Title :
Acoustic microscopy-an industrial view
Author :
Kessler, Lawrance W.
Author_Institution :
Sonoscan Inc., Bensenville, IL, USA
Abstract :
The author describes the three different acoustic-microscopy methods: scanning laser acoustic microscopy (SLAM), scanning acoustic microscopy (SAM), and modernized high-resolution C-scan systems. He then illustrates their respective zones of application within samples. It is concluded that each of the techniques has many noncompeting applications in the fields of nondestructive testing materials characterization, electronic component inspection, and biomedical research
Keywords :
acoustic microscopy; SAM; SLAM; acoustic-microscopy; biomedical research; electronic component inspection; high-resolution C-scan; materials characterization; nondestructive testing; scanning acoustic microscopy; scanning laser acoustic microscopy; Biological materials; Biomedical acoustics; Biomedical materials; Electronic components; Inspection; Laser modes; Microscopy; Nondestructive testing; Optical materials; Simultaneous localization and mapping;
Conference_Titel :
Ultrasonics Symposium, 1988. Proceedings., IEEE 1988
Conference_Location :
Chicago, IL
DOI :
10.1109/ULTSYM.1988.49473
