DocumentCode
3446787
Title
Acoustic microscopy-an industrial view
Author
Kessler, Lawrance W.
Author_Institution
Sonoscan Inc., Bensenville, IL, USA
fYear
1988
fDate
2-5 Oct 1988
Firstpage
725
Abstract
The author describes the three different acoustic-microscopy methods: scanning laser acoustic microscopy (SLAM), scanning acoustic microscopy (SAM), and modernized high-resolution C-scan systems. He then illustrates their respective zones of application within samples. It is concluded that each of the techniques has many noncompeting applications in the fields of nondestructive testing materials characterization, electronic component inspection, and biomedical research
Keywords
acoustic microscopy; SAM; SLAM; acoustic-microscopy; biomedical research; electronic component inspection; high-resolution C-scan; materials characterization; nondestructive testing; scanning acoustic microscopy; scanning laser acoustic microscopy; Biological materials; Biomedical acoustics; Biomedical materials; Electronic components; Inspection; Laser modes; Microscopy; Nondestructive testing; Optical materials; Simultaneous localization and mapping;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1988. Proceedings., IEEE 1988
Conference_Location
Chicago, IL
Type
conf
DOI
10.1109/ULTSYM.1988.49473
Filename
49473
Link To Document