Title :
Radiation tolerant digital signal processor transformation
Author :
Sampson, Steven ; Ramaswamy, Shankarnaryanan ; Alcorn, Charles ; Haddad, Nadim ; Lawson, David ; Page, Thomas ; Scandalis, George ; Scott, Thomas ; Robinson, Parker ; Bain, David
Author_Institution :
Air Force Res. Lab., Kirtland AFB, NM, USA
Abstract :
Under the sponsorship of the AFRL AISM program, LMFS teamed with ADI to successfully demonstrate the layout transfer, fabrication and verification of a commercial equivalent Analog Devices Signal Processor (ADSP) 21020 into LMFS´s radiation hardened process. This report contains activities related to layout transfer, hardware fabrication, test, and electrical characterization. ADSP-21020 is a widely used floating point digital signal processor (DSP) in commercial applications. The Military Satellite Communications Program Office showed a high level of interest in a radiation tolerant digital signal processor (RTDSP) based on the ADSP-21020. A radiation tolerant ADSP-21020 will be an enabling factor in several applications such as image processing, digital filtering and convolution, fast Fourier transforms, data encryption, packet switching, and guidance/navigation processing. In addition, RTDSP can support new space systems applications
Keywords :
CMOS digital integrated circuits; digital signal processing chips; integrated circuit layout; integrated circuit testing; military avionics; radiation hardening (electronics); space vehicle electronics; ADSP-21020; ASIC; CMOS process; SEU analysis; commercial equivalent DSP; convolution; data encryption; digital filtering; electrical characterization; fast Fourier transforms; floating point digital signal processor; guidance/navigation processing; hardware fabrication; image processing; layout transfer; packet switching; radiation tolerant DSP transformation; simulation; space systems applications; test; total ionizing dose; Digital filters; Digital signal processing; Digital signal processors; Fabrication; Hardware; Image processing; Military satellites; Radiation hardening; Signal processing; Testing;
Conference_Titel :
Aerospace Conference, 1999. Proceedings. 1999 IEEE
Conference_Location :
Snowmass at Aspen, CO
Print_ISBN :
0-7803-5425-7
DOI :
10.1109/AERO.1999.793171
