DocumentCode
3446882
Title
A step-by-step method for elimination of burn-in as a necessary screen
Author
Turner, Timothy E.
Author_Institution
Keithley Instrum. Inc., Cleveland, OH, USA
fYear
1996
fDate
20-23 Oct 1996
Firstpage
82
Lastpage
86
Abstract
Burn-in is an expensive technique and is far from the most effective technique available for reliability improvement or process monitoring. One hundred percent burn-in programs required by high infant mortality programs can be eliminated by a combination of in-line testing and process improvements driven by improved feedback techniques. Sample burn-in programs can be eliminated through the use of hierarchical proactive reliability monitoring programs based on the process, not the product
Keywords
integrated circuit reliability; integrated circuit testing; burn-in; feedback; in-line testing; infant mortality; process monitoring; reliability monitoring; screen; Costs; Delay effects; Electronics industry; Etching; Humans; Modems; Process control; Raw materials; Semiconductor materials; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop, 1996., IEEE International
Conference_Location
Lake Tahoe, CA
Print_ISBN
0-7803-3598-8
Type
conf
DOI
10.1109/IRWS.1996.583389
Filename
583389
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