Title :
Study on malfunction mechanism of semiconductor circuit breaker in 400V DC power supply system
Author :
Abe, Seiya ; Nomura, Kosuke ; Fukushima, Kentaro ; Shoyama, Masahito ; Ninomiya, Tamotsu ; Matsumoto, Akira ; Fukui, Akiyoshi ; Yamasaki, Mikio
Author_Institution :
Kyushu Univ., Fukuoka, Japan
Abstract :
Recently, DC power supply systems have been widely viewed as an energy-saving solution. The protection of the system from over current is one of the most important factors in DC power supply system. This paper presents malfunction mechanism of a semiconductor circuit breaker.
Keywords :
circuit breakers; overcurrent protection; power supplies to apparatus; DC power supply system; malfunction mechanism; overcurrent protection; semiconductor circuit breaker; voltage 400 V; Circuit breakers; Circuit noise; Cooling; Electric breakdown; Energy consumption; Fuel cells; Photovoltaic systems; Power supplies; Semiconductor device noise; Voltage; DC Power Supply System; Malfunction; Noise Current; Semiconductor Circuit Breaker;
Conference_Titel :
Power Electronics Conference (IPEC), 2010 International
Conference_Location :
Sapporo
Print_ISBN :
978-1-4244-5394-8
DOI :
10.1109/IPEC.2010.5542368
