Title :
A multi-channel charge readout IC without dead time for X-ray security imaging
Author :
Xu Wang ; Hongyan Yang ; Ying Yuan ; Wuchen Wu
Author_Institution :
VLSI & Syst. Lab., Beijing Univ. of Technol., Beijing, China
Abstract :
A multi-channel charge readout integrated circuit (IC) which converts detector charge to analog voltage without dead time for X-ray security imaging is described. The charge readout IC provides 32 channels of circuit having a max dynamic range of 15 bit and is comprised of charge amplifier gain control, timing generator, shift register chain, charge amplifier array, sample/hold (S/H) stage amplifier and driver etc. It was fabricated using 0.6 um standard CMOS process, and occupies a die area of 2.9 mm × 7.1 mm. It operates at 4 MHz, consumes 45 mW from 5 V supply and 3.5 V as reference, and has a demonstrated output noise performance of 90 uVrms on 31.5 pF of charge amplifier gain capacitance and 52 pF of photodiode (PD) terminal capacitance.
Keywords :
CMOS image sensors; X-ray imaging; amplifiers; detector circuits; integrated circuit noise; readout electronics; IC; PD; S-H; X-ray security imaging; analog voltage; capacitance 31.5 pF; capacitance 52 pF; charge amplifier array; charge amplifier gain capacitance; charge amplifier gain control; dead time; detector charge conversion; driver; frequency 4 MHz; multichannel charge readout integrated circuit; output noise performance; photodiode terminal capacitance; power 45 mW; sample-hold stage amplifier; shift register chain; size 0.6 mum; standard CMOS process; timing generator; voltage 5 V; voltage 90 muV; word length 15 bit; Imaging; Integrated circuits; Noise; Security; Thermal noise; Thermal resistance; X-ray imaging; Dead time; Dynamic range; Multi-channel charge readout IC; X-ray security imaging;
Conference_Titel :
Image and Signal Processing (CISP), 2012 5th International Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4673-0965-3
DOI :
10.1109/CISP.2012.6469898
