Title :
An optical comparison of silicone and EVA encapsulants for conventional silicon PV modules: A ray-tracing study
Author :
McIntosh, Keith R. ; Cotsell, James N. ; Cumpston, Jeff S. ; Norris, Ann W. ; Powell, Nick E. ; Ketola, Barry M.
Author_Institution :
Centre for Sustainable Energy Syst., Australian Nat. Univ., Canberra, ACT, Australia
Abstract :
Ray-trace simulation is used to quantify the optical losses of photovoltaic modules containing silicon cells. The simulations show that when the module´s encapsulant is silicone rather than ethylene vinyl acetate (EVA), the module´s short-circuit current density under the AM1-5g spectrum is 0.7-1.1% higher for screen-printed multi-cSi cells, 0.5-1.2% higher for screen-printed mono-cSi cells, and 1.0-1.6% higher for high-efficiency rear-contact cells, depending on the type of silicone. This increase is primarily due to the transmission of short-wavelength light (<420 nm) and is therefore greatest when used with low UV-absorbing glass and cells of a high IQE at short wavelength. We also quantify absorption in the glass, EVA and silicone at longer wavelengths and describe the influence of an encapsulant´s refractive index on escape losses.
Keywords :
current density; elemental semiconductors; encapsulation; light absorption; ray tracing; refractive index; silicon; silicones; solar cells; AM1-5g spectrum; EVA encapsulants; Si; escape loss; ethylene vinyl acetate; low UV-absorbing glass; optical losses; ray-trace simulation; ray-tracing study; rear-contact cells; refractive index; screen-printed multi-cSi cells; short-circuit current density; short-wavelength light transmission; silicon cells; silicon photovoltaic modules; silicone encapsulants; Absorption; Current density; Glass; Optical losses; Optical refraction; Optical variables control; Photovoltaic systems; Ray tracing; Silicon; Solar power generation;
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2009 34th IEEE
Conference_Location :
Philadelphia, PA
Print_ISBN :
978-1-4244-2949-3
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2009.5411624