DocumentCode :
3447162
Title :
Discussion Group Summary Building In Reliability
Author :
Prendergast, James ; Steeves, John
Author_Institution :
Analog Devices Inc.
fYear :
1996
fDate :
20-23 Oct. 1996
Firstpage :
161
Lastpage :
162
Keywords :
Circuit testing; Costs; Electromigration; Electronics industry; Fabrication; Integrated circuit reliability; Life testing; Manufacturing processes; Personnel; Reliability engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop, 1996., IEEE International
Conference_Location :
Lake Tahoe, CA, USA
Print_ISBN :
0-7803-3598-8
Type :
conf
DOI :
10.1109/IRWS.1996.583402
Filename :
583402
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3447162
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